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AccésVista prèviaData publicacióTítolAutor/s
Acceso abierto2016_Chielle_etal_IEEE-TNS_final.pdf.jpgd’agost-2016Reliability on ARM Processors Against Soft Errors Through SIHFT TechniquesChielle, Eduardo; Rosa, Felipe; Rodrigues, Gennaro S.; Tambara, Lucas A.; Tonfat, Jorge; Macchione, Eduardo; Aguirre, Fernando; Added, Nemitala; Medina, Nilberto; Aguiar, Vitor; Silveira, Marcilei A.G.; Ost, Luciano; Reis, Ricardo; Cuenca-Asensi, Sergio; Kastensmidt, Fernanda L.
Acceso abierto2015_Chielle_etal_IEEE-TNS_final.pdf.jpg11-de desembre-2015S-SETA: Selective Software-Only Error-Detection Technique Using AssertionsChielle, Eduardo; Rodrigues, Gennaro S.; Kastensmidt, Fernanda L.; Cuenca-Asensi, Sergio; Tambara, Lucas A.; Rech, Paolo; Quinn, Heather
Acceso abierto2013_Restrepo_etal_JElectronTest_final.pdf.jpgde desembre-2013Selective SWIFT-R. A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded SystemsRestrepo Calle, Felipe; Martínez-Álvarez, Antonio; Cuenca-Asensi, Sergio; Jimeno-Morenilla, Antonio
Acceso abierto2019_Serrano-Cases_etal_IEEE-TNS_final.pdf.jpgde juliol-2019Nonintrusive Automatic Compiler-Guided Reliability Improvement of Embedded Applications Under Proton IrradiationSerrano-Cases, Alejandro; Morilla, Yolanda; Martín-Holgado, Pedro; Cuenca-Asensi, Sergio; Martínez-Álvarez, Antonio
Acceso abiertoPena-Fernandez_etal_2022_IEEE-TNS_final.pdf.jpg7-de febrer-2022Hybrid Lockstep Technique for Soft Error MitigationPeña-Fernández, Manuel; Serrano-Cases, Alejandro; Lindoso, Almudena; Cuenca-Asensi, Sergio; Entrena, Luis; Morilla, Yolanda; Martín-Holgado, Pedro; Martínez-Álvarez, Antonio
Acceso abiertoSerrano-Cases_etal_2020_IEEE-TNS_final.pdf.jpg11-de maig-2020Empirical Mathematical Model of Microprocessor Sensitivity and Early Prediction to Proton and Neutron Radiation-Induced Soft ErrorsSerrano-Cases, Alejandro; Reyneri, Leonardo M.; Morilla, Yolanda; Cuenca-Asensi, Sergio; Martínez-Álvarez, Antonio
Acceso abiertoSerrano-Cases_etal_2020_JElectronTest_final.pdf.jpgde febrer-2020Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded SystemsSerrano-Cases, Alejandro; Restrepo Calle, Felipe; Cuenca-Asensi, Sergio; Martínez-Álvarez, Antonio
Acceso abierto2019_Reyneri_etal_Electronics.pdf.jpg10-de juny-2019A Compact Model to Evaluate the Effects of High Level C++ Code Hardening in Radiation EnvironmentsReyneri, Leonardo M.; Serrano-Cases, Alejandro; Morilla, Yolanda; Cuenca-Asensi, Sergio; Martínez-Álvarez, Antonio
Acceso abierto2018_Isaza-Gonzalez_etal_MicroelectronicsReliability_final.pdf.jpgde setembre-2018SHARC: An efficient metric for selective protection of software against soft errorsIsaza-González, José; Restrepo Calle, Felipe; Martínez-Álvarez, Antonio; Cuenca-Asensi, Sergio
Acceso abiertoAponte-Moreno_etal_2023_MicroprocesMicrosyst.pdf.jpg12-de novembre-2022Evaluation of fault injection tools for reliability estimation of microprocessor-based embedded systemsAponte-Moreno, Alexander; Isaza-González, José; Serrano-Cases, Alejandro; Martínez-Álvarez, Antonio; Cuenca-Asensi, Sergio; Restrepo Calle, Felipe

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