Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques
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http://hdl.handle.net/10045/62196
Títol: | Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques |
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Autors: | Chielle, Eduardo | Rosa, Felipe | Rodrigues, Gennaro S. | Tambara, Lucas A. | Tonfat, Jorge | Macchione, Eduardo | Aguirre, Fernando | Added, Nemitala | Medina, Nilberto | Aguiar, Vitor | Silveira, Marcilei A.G. | Ost, Luciano | Reis, Ricardo | Cuenca-Asensi, Sergio | Kastensmidt, Fernanda L. |
Grups d'investigació o GITE: | UniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicante |
Centre, Departament o Servei: | Universidad de Alicante. Departamento de Tecnología Informática y Computación |
Paraules clau: | Aerospace applications | Error detection | Fault coverage | Fault tolerance | Mitigation techniques | Processors | Reliability | Soft errors | Software techniques |
Àrees de coneixement: | Arquitectura y Tecnología de Computadores |
Data de publicació: | d’agost-2016 |
Editor: | IEEE |
Citació bibliogràfica: | IEEE Transactions on Nuclear Science. 2016, 63(4): 2208-2216. doi:10.1109/TNS.2016.2525735 |
Resum: | ARM processors are leaders in embedded systems, delivering high-performance computing, power efficiency, and reduced cost. For this reason, there is a relevant interest for its use in the aerospace industry. However, the use of sub-micron technologies has increased the sensitivity to radiation-induced transient faults. Thus, the mitigation of soft errors has become a major concern. Software-Implemented Hardware Fault Tolerance (SIHFT) techniques are a low-cost way to protect processors against soft errors. On the other hand, they cause high overheads in the execution time and memory, which consequently increase the energy consumption. In this work, we implement a set of software techniques based on different redundancy and checking rules. Furthermore, a low-overhead technique to protect the program execution flow is included. Tests are performed using the ARM Cortex-A9 processor. Simulated fault injection campaigns and radiation test with heavy ions have been performed. Results evaluate the trade-offs among fault detection, execution time, and memory footprint. They show significant improvements of the overheads when compared to previously reported techniques. |
Patrocinadors: | This work was supported in part by CNPq and CAPES, Brazilian agencies. |
URI: | http://hdl.handle.net/10045/62196 |
ISSN: | 0018-9499 (Print) | 1558-1578 (Online) |
DOI: | 10.1109/TNS.2016.2525735 |
Idioma: | eng |
Tipus: | info:eu-repo/semantics/article |
Drets: | © 2016 IEEE |
Revisió científica: | si |
Versió de l'editor: | http://dx.doi.org/10.1109/TNS.2016.2525735 |
Apareix a la col·lecció: | INV - UNICAD - Artículos de Revistas |
Arxius per aquest ítem:
Arxiu | Descripció | Tamany | Format | |
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2016_Chielle_etal_IEEE-TNS_final.pdf | Versión final (acceso restringido) | 2,31 MB | Adobe PDF | Obrir Sol·licitar una còpia |
2016_Chielle_etal_IEEE-TNS_accepted.pdf | Accepted Manuscript (acceso abierto) | 2,33 MB | Adobe PDF | Obrir Vista prèvia |
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