Method for the characterization of hologram processing

Abstract

A novel method for the characterization of the processing of both absorption and phase holograms is proposed. Differently from the previous models, the square root of the diffraction efficiency of the processed hologram was directly related to the amplitude of the optical density modulation obtained at the developed step. This characteristic is a good indicator of the degree of nonlinearity of the hologram processing. While the Lin functions of phase holograms are similar to those of absorption holograms, the shape of the proposed function is completely different. The optical density and diffraction efficiency of holograms recorded using Agfa-Geveart 8E75HD plates and processed with AAC developer and a solvent bleach without a fixation step were measured and used to demonstrate the method.