Copper underpotential deposition at gold surfaces in contact with a deep eutectic solvent: New insights

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Title: Copper underpotential deposition at gold surfaces in contact with a deep eutectic solvent: New insights
Authors: Sebastián, Paula | Gómez, Elvira | Climent, Victor | Feliu, Juan M.
Research Group/s: Electroquímica de Superficies
Center, Department or Service: Universidad de Alicante. Departamento de Química Física | Universidad de Alicante. Instituto Universitario de Electroquímica
Keywords: Single crystal | Deep eutectic solvent | Interface | Underpotential deposition | Chloride
Knowledge Area: Química Física
Issue Date: May-2017
Publisher: Elsevier
Citation: Electrochemistry Communications. 2017, 78: 51-55. doi:10.1016/j.elecom.2017.03.020
Abstract: The electrodeposition of copper on a polycrystalline gold electrode and on Au(hkl) single crystals was investigated in a deep eutectic solvent (DES). The DES employed consisted of a mixture of choline chloride and urea (1:2). The Au(hkl)/DES interface was studied using cyclic voltammetry in the capacitive region. The blank voltammograms showed characteristic features, not previously reported, that demonstrate the surface sensitivity of this solvent. Copper electrodeposition was then studied and it was found that this takes place through the formation of an underpotential deposition (UPD) adlayer, demonstrating the surface sensitivity of this process. Voltammetric profiles showed similarities with those obtained in aqueous solutions containing chloride, suggesting that the copper UPD in this DES is strongly influenced by the presence of chloride.
Sponsor: Financial support from MINECO through projects CTQ2016-76221-P (AEI/FEDER, UE) and TEC2014-51940-C2-2-R (AEI/FEDER, UE) are greatly acknowledged. P. Sebastian also acknowledges MECD for FPU grant.
URI: http://hdl.handle.net/10045/65514
ISSN: 1388-2481 (Print) | 1873-1902 (Online)
DOI: 10.1016/j.elecom.2017.03.020
Language: eng
Type: info:eu-repo/semantics/article
Rights: © 2017 Elsevier B.V.
Peer Review: si
Publisher version: http://dx.doi.org/10.1016/j.elecom.2017.03.020
Appears in Collections:INV - EQSUP - Artículos de Revistas

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