Efficient Mitigation of Data and Control Flow Errors in Microprocessors
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http://hdl.handle.net/10045/46072
Title: | Efficient Mitigation of Data and Control Flow Errors in Microprocessors |
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Authors: | Parra, Luis | Lindoso, Almudena | Portela, Marta | Entrena, Luis | Restrepo Calle, Felipe | Cuenca-Asensi, Sergio | Martínez-Álvarez, Antonio |
Research Group/s: | UniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicante |
Center, Department or Service: | Universidad de Alicante. Departamento de Tecnología Informática y Computación |
Keywords: | Fault tolerance | Microprocessor | Single event transient (SETs) | Single event upset (SEUs) | Soft error |
Knowledge Area: | Arquitectura y Tecnología de Computadores |
Issue Date: | Aug-2014 |
Publisher: | IEEE |
Citation: | IEEE Transactions on Nuclear Science. 2014, 61(4): 1590-1596. doi:10.1109/TNS.2014.2310492 |
Abstract: | The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of both SEUs and SETs. Furthermore, the overheads incurred by our technique can be perfectly assumable in low-cost systems. |
Sponsor: | This work was supported in part by the Spanish Government under contracts TEC2010-22095-C03-03 and PHB2012-0158-PC. |
URI: | http://hdl.handle.net/10045/46072 |
ISSN: | 0018-9499 (Print) | 1558-1578 (Online) |
DOI: | 10.1109/TNS.2014.2310492 |
Language: | eng |
Type: | info:eu-repo/semantics/article |
Rights: | © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works |
Peer Review: | si |
Publisher version: | http://dx.doi.org/10.1109/TNS.2014.2310492 |
Appears in Collections: | INV - UNICAD - Artículos de Revistas |
Files in This Item:
File | Description | Size | Format | |
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2014_Parra_etal_IEEE-TNS_final.pdf | Versión final (acceso restringido) | 717,31 kB | Adobe PDF | Open Request a copy |
2014_Parra_etal_IEEE-TNS_preprint.pdf | Preprint (acceso abierto) | 551,84 kB | Adobe PDF | Open Preview |
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