Efficient Mitigation of Data and Control Flow Errors in Microprocessors

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Title: Efficient Mitigation of Data and Control Flow Errors in Microprocessors
Authors: Parra, Luis | Lindoso, Almudena | Portela, Marta | Entrena, Luis | Restrepo Calle, Felipe | Cuenca-Asensi, Sergio | Martínez-Álvarez, Antonio
Research Group/s: UniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicante
Center, Department or Service: Universidad de Alicante. Departamento de Tecnología Informática y Computación
Keywords: Fault tolerance | Microprocessor | Single event transient (SETs) | Single event upset (SEUs) | Soft error
Knowledge Area: Arquitectura y Tecnología de Computadores
Issue Date: Aug-2014
Publisher: IEEE
Citation: IEEE Transactions on Nuclear Science. 2014, 61(4): 1590-1596. doi:10.1109/TNS.2014.2310492
Abstract: The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of both SEUs and SETs. Furthermore, the overheads incurred by our technique can be perfectly assumable in low-cost systems.
Sponsor: This work was supported in part by the Spanish Government under contracts TEC2010-22095-C03-03 and PHB2012-0158-PC.
URI: http://hdl.handle.net/10045/46072
ISSN: 0018-9499 (Print) | 1558-1578 (Online)
DOI: 10.1109/TNS.2014.2310492
Language: eng
Type: info:eu-repo/semantics/article
Rights: © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works
Peer Review: si
Publisher version: http://dx.doi.org/10.1109/TNS.2014.2310492
Appears in Collections:INV - UNICAD - Artículos de Revistas

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